الجامعة :جامعة المنصورة |
الكلية :كلية العلوم |
القسم :الفيزياء |
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| 1- بيانات المقرر :- |
| | الرمز الكودى: | 14301 | | اسم المقرر: | فيزياء تجريبة (1) | | الفرقة: | ثالثة كيمياء وفيزياء | | عنوان البرنامج: | - B. Sc. Physics & Chemistry
| | التخصص: | | | عدد الساعات: | نظري: | 2 | فصل: | | عملى: | 4 |
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| 2- أهداف المقرر :- |
| - Introduce the student to the concept of errors in experimental data and graph.
- Acquaint the students with different methods to estimate the best experimental data and graph.
- Use the principal of vacuum techniques and the operation of pumps and gauges for measuring at low pressure
- Outline the basic information of different method of thin film preparation and its process
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| 3- نواتج التعلم المستهدفة للمقرر :- |
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| 4- محتويات المقرر :- |
| | م | الموضوع | الأسبوع |
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| 1 | THE EXPERMENTAL ERRORS:- (Definitions-Random and symetric errors-Combination of errors- Applications) | | | 2 | ESTAMATION OF BEST LINE GRAPH:- (By eye-Quick method-By zero sum-Centriod method-Statistical method) | | | 3 | VACUUM TECHNIQUES:- (Introduction-Speed of pumps-Basic design-Rotary pump-Roots pump-Vapour pumps) | | | 4 | GAUGES MEASURE LOW PRESSURE:- (Discharge tube-McLeod gauge-heat conductivity gauge-Ionization gauges) | | | 5 | TYPICAL VACUUM SYSTEM:- (Factors affecting the choise of the pump-Electron microscope-Evaporating unit) | | | 6 | PREPARATION OF THIN FILM:-(Electrodeposition-Vacuumdeposition-Advantage and disadvantage of every one) | | | 7 | STRUCTURE OF THIN FILM:-(Electron diffraction camera-Microscopic details-Formation process-Structure) | | | 8 | THIN FILM ELECTRONIC DEVICE:-(Resistor-Capacitor-Conductor-Inductor) | |
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| 5- أساليب التعليم والتعلم :- |
| | م | الاسلوب |
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| Lectures using data show and board. | | Class activity. | | Laboratory work. |
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| 6- أساليب التعليم والتعلم للطلاب ذوى القدرات المحدودة :- |
| - لايوجد
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| 7- تقويم الطلاب :- |
| أ- التوقيت |
| | م | الطريقة | الأسبوع |
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| 1 | Written exam | 14 | | 2 | Oral exam | 14 | | 3 | Practical exam | 12 |
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| ب- توزيع الدرجات |
| | م | الطريقة | الدرجة |
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| 1 | امتحان نصف الترم | 0 | | 2 | امتحان آخر الترم | 70 | | 3 | الامتحان الشفوى | 10 | | 4 | الامتحان العملى | 20 | | 5 | أعمال الترم | 0 | | 6 | طرق أخرى للتقييم | 0 | | المجموع | 100% |
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| 8- قائمة الكتب الدراسية والمراجع |
| | م | العنصر | النوع |
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| 1 | "Thin Film", K.D. Leaver & B. N. Chapman. | | | 2 | "Expermental Physics for Students", R. M. Whittle and J. Yarwood. | | | 3 | "Scientific Foundations of Vacuum Techniques", S. Dushmon, second edition, London (1966). | | | 4 | "Experimental Techniques in Physical Metallurgy", V. T. Cherepin. | |
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| 9- مصفوفة المعارف والمهارات المستهدفة من المقرر الدراسي |
| | م | المحتوى | أسبوع الدراسة |
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| THE EXPERMENTAL ERRORS:- (Definitions-Random and symetric errors-Combination of errors- Applications) | | | ESTAMATION OF BEST LINE GRAPH:- (By eye-Quick method-By zero sum-Centriod method-Statistical method) | | | VACUUM TECHNIQUES:- (Introduction-Speed of pumps-Basic design-Rotary pump-Roots pump-Vapour pumps) | | | GAUGES MEASURE LOW PRESSURE:- (Discharge tube-McLeod gauge-heat conductivity gauge-Ionization gauges) | | | TYPICAL VACUUM SYSTEM:- (Factors affecting the choise of the pump-Electron microscope-Evaporating unit) | | | PREPARATION OF THIN FILM:-(Electrodeposition-Vacuumdeposition-Advantage and disadvantage of every one) | | | STRUCTURE OF THIN FILM:-(Electron diffraction camera-Microscopic details-Formation process-Structure) | | | THIN FILM ELECTRONIC DEVICE:-(Resistor-Capacitor-Conductor-Inductor) | |
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| اساتذة المادة: - |
| - مايسه اسماعيل عبد الحميد اسماعيل
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| رئيس مجلس القسم العلمى: - |
| محمد عبد القادر حسن مدكور |
